S.S. Duvvuri: search on Z-Library

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1

Syringe-injectable electronics

Liu, Jia, Fu, Tian-Ming, Cheng, Zengguang, Hong, Guosong, Zhou, Tao, Jin, Lihua, Duvvuri, Madhavi, Jiang, Zhe, Kruskal, Peter, Xie, Chong, Suo, Zhigang, Fang, Ying, Lieber, Charles M.

Journal:

Nature Nanotechnology

Year:

2015

Language:

english

File:

PDF, 11.61 MB

english, 2015

2

Trends and challenges to ESD and Latch-up designs for nanometer CMOS technologies

G. Boselli, C. Duvvury

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 1.35 MB

english, 2005

3

Granulation time in fluidized bed granulators

Papiya Roy, Rajesh Khanna, Duvvuri Subbarao

Journal:

Powder Technology

Year:

2010

Language:

english

File:

PDF, 638 KB

english, 2010

4

[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - CDM peak current variations and impact upon CDM performance thresholds

Jahanzeb, Agha, Yen-Yi Lin,, Marum, Steve, Schichl, Joe, Charvaka Duvvury,

Year:

2007

Language:

english

File:

PDF, 838 KB

english, 2007

5

A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies

S Voldman, W Anderson, R Ashton, M Chaine, C Duvvury, T Maloney, E Worley

Journal:

Microelectronics Reliability

Year:

2001

Language:

english

File:

PDF, 624 KB

english, 2001

6

The impact of technology scaling on ESD robustness and protection circuit design

Amerasekera, A., Duvvury, C.

Journal:

IEEE Transactions on Components Packaging and Manufacturing Technology Part A

Year:

1995

Language:

english

File:

PDF, 744 KB

english, 1995

7

Antimicrobial Polymers

Jain, Anjali, Duvvuri, L. Sailaja, Farah, Shady, Beyth, Nurit, Domb, Abraham J., Khan, Wahid

Journal:

Advanced Healthcare Materials

Year:

2014

Language:

english

File:

PDF, 566 KB

english, 2014

8

Price stability, financial stability, and sovereign debt sustainability policy challenges from the new trilemma

Subbarao, Duvvuri

Journal:

Macroeconomics and Finance in Emerging Market Economies

Year:

2012

Language:

english

File:

PDF, 230 KB

english, 2012

9

Spatial Models in Marketing

Eric T. Bradlow, Bart Bronnenberg, Gary J. Russell, Neeraj Arora, David R. Bell, Sri Devi Duvvuri, Frankel Ter Hofstede, Catarina Sismeiro, Raphael Thomadsen, Sha Yang

Journal:

Marketing Letters

Year:

2005

Language:

english

File:

PDF, 168 KB

english, 2005

10

Latchup in voltage tolerant circuits: a new phenomenon

Jorge Salcedo-Suñer, Charvaka Duvvury, Roger Cline, Alfonso Cadena-Hernandez

Journal:

Microelectronics Reliability

Year:

2004

Language:

english

File:

PDF, 831 KB

english, 2004

11

[IEEE 30th Annual Proceedings Reliability Physics 1992 - San Diego, CA, USA (1992.03.31-1992.04.2)] 30th Annual Proceedings Reliability Physics 1992 - Dynamic gate coupling of NMOS for efficient output ESD protection

Duvvury, C., Diaz, C.

Year:

1992

File:

PDF, 767 KB

1992

12

[IEEE Proceedings of IEEE International Electron Devices Meeting - San Francisco, CA, USA (1989.12.3-1989.12.6)] International Technical Digest on Electron Devices Meeting - Achieving uniform nMOS device power distribution for sub-micron ESD reliability

Duvvury,, Diaz,, Haddock,

Year:

1992

Language:

english

File:

PDF, 366 KB

english, 1992

13

Prediction of Charged Device Model Peak Discharge Current for Microelectronic Components

Shukla, Vrashank, Boselli, Gianluca, Dissegna, Mariano, Duvvury, Charvaka, Sankaralingam, Raj, Rosenbaum, Elyse

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2014

Language:

english

File:

PDF, 1.52 MB

english, 2014

14

[IEEE 2018 8th IEEE India International Conference on Power Electronics (IICPE) - JAIPUR, India (2018.12.13-2018.12.15)] 2018 8th IEEE India International Conference on Power Electronics (IICPE) - Bearing Fault Detection in Induction Motors Using Discrete-time Extended Kalman Filter

Duvvuri, Sarathbabu, Malladi, Srikanth, Padmaja, S M, Sai Rama Lakshmi, Iluri, Naveena, Saka, Bondada, Jyothi

Year:

2018

Language:

english

File:

PDF, 497 KB

english, 2018

15

A synthesis of ESD input protection scheme

Charvaka Duvvury, Robert Rountree

Journal:

Journal of Electrostatics

Year:

1992

Language:

english

File:

PDF, 1.34 MB

english, 1992

16

Development of substrate-pumped nMOS protection for a 0.13 μm technology

Craig Salling, Jerry Hu, Jeff Wu, Charvaka Duvvury, Roger Cline, Rith Pok

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 446 KB

english, 2002

17

Impact of scaling on the high current behavior of RF CMOS technology

Boselli, G., Reddy, V., Duvvury, C.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2004

Language:

english

File:

PDF, 451 KB

english, 2004

18

Electrical overstress and electrostatic discharge

Diaz, C., Kang, S.M., Duvvury, C.

Journal:

IEEE Transactions on Reliability

Year:

1995

Language:

english

File:

PDF, 472 KB

english, 1995

19

Advanced CMOS protection device trigger mechanisms during CDM

Duvvury, C., Amerasekera, A.

Journal:

IEEE Transactions on Components Packaging and Manufacturing Technology Part C

Year:

1996

Language:

english

File:

PDF, 198 KB

english, 1996

20

Characterization and Optimization of Sub-32-nm FinFET Devices for ESD Applications

Thijs, S., Tremouilles, D., Russ, C., Griffoni, A., Collaert, N., Rooyackers, R., Linten, D., Scholz, M., Duvvury, C., Gossner, H., Jurczak, M., Groeseneken, G.

Journal:

IEEE Transactions on Electron Devices

Year:

2008

Language:

english

File:

PDF, 482 KB

english, 2008

21

[IEEE 1994 IEEE International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1994)] Proceedings of 1994 IEEE International Electron Devices Meeting - Device integration for ESD robustness of high voltage power MOSFETs

Duvvury, C., Rodriguez, J., Jones, C., Smayling, M.

Year:

1994

Language:

english

File:

PDF, 326 KB

english, 1994

22

A description of arterial variants in the transoral approach to the parapharyngeal space

Wang, Chengyuan, Kundaria, Summit, Fernandez-Miranda, Juan, Duvvuri, Umamaheswar

Journal:

Clinical Anatomy

Year:

2014

Language:

english

File:

PDF, 610 KB

english, 2014

23

[IEEE 1998 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (12-15 Oct. 1998)] 1998 IEEE International Integrated Reliability Workshop Final Report (Cat. No.98TH8363) - Electrostatic discharge (ESD) technology benchmarking strategy for evaluating ESD robustness of CMOS technologies

Voldman, S., Anderson, W., Ashton, R., Chaine, M., Duvvury, C., Maloney, T., Worley, E.

Year:

1998

Language:

english

File:

PDF, 699 KB

english, 1998

24

[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Impact of Strain on ESD Robustness of FinFET Devices

Griffoni, A., Thijs, S., Russ, C., Tremouilles, D., Scholz, M., Linten, D., Collaert, N., Rooyackers, R., Duvvury, C., Gossner, H., Meneghesso, G., Groeseneken, G.

Year:

2008

Language:

english

File:

PDF, 378 KB

english, 2008

25

[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - A new I/O signal latchup phenomenon in voltage tolerant ESD protection circuits

Salcedo-Suner, J., Cline, R., Duvvury, C., Cadena-Hernandez, A., Ting, L., Schichl, J.

Year:

2003

Language:

english

File:

PDF, 382 KB

english, 2003

26

[IEEE 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Anaheim, CA, USA (2007.09.16-2007.09.21)] 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Understanding the optimization of sub-45nm FinFET devices for ESD applications

Tremouilles, D., Thijs, S., Russ, C., Schneider, J., Duvvury, C., Collaert, N., Linten, D., Scholz, M., Jurczak, M., Gossner, H., Groeseneken, G.

Year:

2007

Language:

english

File:

PDF, 1001 KB

english, 2007

27

Analysis of gate-bias-induced heating effects in deep-submicron ESD protection designs

Kwang-Hoon Oh,, Duvvury, C., Banerjee, K., Dutton, R.W.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2002

Language:

english

File:

PDF, 961 KB

english, 2002

28

ESD protection: design and layout issues for VLSI circuits

Duvvury, C., Rountree, R.N., McPhee, R.A.

Journal:

IEEE Transactions on Industry Applications

Year:

1989

Language:

english

File:

PDF, 686 KB

english, 1989

29

PHYSICAL SPOUSAL VIOLENCE AGAINST WOMEN IN INDIA: SOME RISK FACTORS

JEYASEELAN, L., KUMAR, SHUBA, NEELAKANTAN, NITHYA, PEEDICAYIL, ABRAHAM, PILLAI, RAJAMOHANAM, DUVVURY, NATA

Journal:

Journal of Biosocial Science

Year:

2007

Language:

english

File:

PDF, 394 KB

english, 2007

30

A description of the anatomy of the glossopharyngeal nerve as encountered in transoral surgery

Wang, Chengyuan, Kundaria, Summit, Fernandez-Miranda, Juan, Duvvuri, Umamaheswar

Journal:

The Laryngoscope

Year:

2016

Language:

english

File:

PDF, 569 KB

english, 2016

31

System Level ESD Co-Design (Duvvury/System Level ESD Co-Design) || Hard Failures and PCB Protection Devices

Duvvury, Charvaka, Gossner, Harald

Year:

2015

Language:

english

File:

PDF, 3.09 MB

english, 2015

32

System Level ESD Co-Design (Duvvury/System Level ESD Co-Design) || Soft Failure Mechanisms and PCB Design Measures

Duvvury, Charvaka, Gossner, Harald

Year:

2015

Language:

english

File:

PDF, 4.84 MB

english, 2015

33

Dynamic Roughness for Manipulation and Control of Turbulent Boundary Layers: An Overview

McKeon, Beverley J., Jacobi, Ian, Duvvuri, Subrahmanyam

Journal:

Year:

2018

Language:

english

File:

PDF, 7.22 MB

english, 2018

34

Tank Current Measurement of Three-Phase Transformer: Its Resonance Behavior and Sensitivity to Detect Mechanical Faults

Pramanik, Saurav, Duvvury, V S B Chaitanya, Sahoo, Subrat

Journal:

IEEE Transactions on Power Delivery

Year:

2019

Language:

english

File:

PDF, 7 KB

english, 2019

35

[IEEE 2019 Symposium on VLSI Circuits - Kyoto, Japan (2019.6.9-2019.6.14)] 2019 Symposium on VLSI Circuits - A -106dBm 33nW Bit-Level Duty-Cycled Tuned RF Wake-up Receiver

Moody, Jesse, Dissanayake, Anjana, Bishop, Henry, Lu, Ruochen, Liu, Ningxi, Duvvuri, Divya, Gao, Anming, Truesdell, Daniel, Barker, N. Scott, Gong, Songbin, Calhoun, Benton H, Bowers, Steven M

Year:

2019

Language:

english

File:

PDF, 339 KB

english, 2019

36

Development of a nanoscale hot-wire probe for supersonic flow applications

Kokmanian, K., Scharnowski, S., Bross, M., Duvvuri, S., Fu, M. K., Kähler, C. J., Hultmark, M.

Journal:

Experiments in Fluids

Year:

2019

Language:

english

File:

PDF, 1.64 MB

english, 2019

37

[IEEE 2018 IEEE MTT-S International Microwave and RF Conference (IMaRC) - Kolkata, India (2018.11.28-2018.11.30)] 2018 IEEE MTT-S International Microwave and RF Conference (IMaRC) - Wind Turbine Clutter Spectrum Analysis of Radar Data and Mitigation at Tracker for Airborne Surveillance Radar

Mamgain, Reena, Rathi, Aparna, Deb, Debasish, Jain, Rashi, Seshagiri, Duvvuri

Year:

2018

File:

PDF, 485 KB

2018

38

Design of an S-Band Nanowatt-Level Wakeup Receiver With Envelope Detector-First Architecture

Bassirian, Pouyan, Duvvuri, Divya, Liu, Ningxi, Truesdell, Daniel, Tsao, Han-Yu, Barker, N. Scott, Calhoun, Benton H., Bowers, Steven M.

Journal:

IEEE Transactions on Microwave Theory and Techniques

Year:

2020

File:

PDF, 6.59 MB

2020

39

ESD issues for advanced CMOS technologies

Charvaka Duvvury, Ajith Amerasekera

Journal:

Microelectronics Reliability

Year:

1996

Language:

english

File:

PDF, 679 KB

english, 1996

40

Gate oxide failures due to anomalous stress from HBM ESD testers

Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline

Journal:

Microelectronics Reliability

Year:

2006

Language:

english

File:

PDF, 280 KB

english, 2006

41

Theoretical analysis of the noise characteristics of an ejector jet

Duvvuri Tirumalesa

Journal:

Journal of Sound and Vibration

Year:

1973

Language:

english

File:

PDF, 805 KB

english, 1973

42

[IEEE 1993 IEEE International Symposium on Circuits and Systems - Chicago, IL, USA (3-6 May 1993)] 1993 IEEE International Symposium on Circuits and Systems - Thermal failure simulation for electrical overstress in semiconductor devices

Diaz, C., Duvvury, C., Kang, S.-M.

Year:

1993

Language:

english

File:

PDF, 392 KB

english, 1993

43

Profiling the reference price consumer

Sangkil Moon, Gary J. Russell, Sri Devi Duvvuri

Journal:

Journal of Retailing

Year:

2006

Language:

english

File:

PDF, 170 KB

english, 2006

44

Endoscopic transnasal anterior skull base resection for the treatment of sinonasal malignancies

Ricardo L. Carrau, Amin B. Kassam, Carl H. Snyderman, Umamaheswar Duvvuri, Arlan Mintz, Paul Gardner

Journal:

Operative Techniques in Otolaryngology-Head and Neck Surgery

Year:

2006

Language:

english

File:

PDF, 1.09 MB

english, 2006

45

Design methodology and optimization of gate-driven NMOS ESD protection circuits in submicron CMOS processes

Chen, J.Z., Amerasekera, E.A., Duvvury, C.

Journal:

IEEE Transactions on Electron Devices

Year:

1998

Language:

english

File:

PDF, 510 KB

english, 1998

46

Analysis of nonuniform ESD current distribution in deep submicron NMOS transistors

Kwang-Hoon Oh, Duvvury, C., Banerjee, K., Dutton, R.W.

Journal:

IEEE Transactions on Electron Devices

Year:

2002

Language:

english

File:

PDF, 2.06 MB

english, 2002

47

Impact of gate-to-contact spacing on ESD performance of salicided deep submicron NMOS transistors

Kwang-Hoon Oh, Duvvury, C., Banerjee, K., Dutton, R.W.

Journal:

IEEE Transactions on Electron Devices

Year:

2002

Language:

english

File:

PDF, 1.03 MB

english, 2002

48

ESD: a pervasive reliability concern for IC technologies

Duvvury, C., Amerasekera, A.

Journal:

Proceedings of the IEEE

Year:

1993

Language:

english

File:

PDF, 1.67 MB

english, 1993

49

Cosmology of generalized modified gravity models

Carroll, Sean M., De Felice, Antonio, Duvvuri, Vikram, Easson, Damien A., Trodden, Mark, Turner, Michael S.

Journal:

Physical Review D

Year:

2005

Language:

english

File:

PDF, 448 KB

english, 2005

50

Synthesis and Characterization of Bimetallic Fe/Co Nanocatalyst on CNTs for Fischer-Tropsch Reaction

Ali, Sardar, Mohd Zabidi, Noor Asmawati, Subbarao, Duvvuri

Journal:

Journal of Nano Research

Year:

2012

Language:

english

File:

PDF, 3.63 MB

english, 2012